Search Results - Chen, Chia-Wei
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Retroreflex Ellipsometry for Nonplanar Surfaces by Chen, Chia-Wei
Published 2025Get full text
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Thin-film metrology; Curved surfaces; Ellipsometry; Mueller matrix; Retroreflex ellipsometry; Dünnschicht- Messtechnik; gekrümmte Oberflächen; Ellipsometrie; Müller-Matrix; Retroreflex-Ellipsometrie
thema EDItEUR::U Computing and Information Technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists