Assunto: 22-nm FD SOI
Assunto: 28-nm FD SOI
Registros relacionados: Radiation Tolerant Electronics, Volume II
- Radiation Tolerant Electronics
- Radiation Effects of Advanced Electronic Devices and Circuits
- Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
- Single-Event Effects, from Space to Accelerator Environments
- Radiation Effects of Advanced Electronic Devices and Circuits
- Radiation Monitoring and Dose Estimation of the Fukushima Nuclear Accident