Single-Event Effects, from Space to Accelerator Environments

This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different ra...

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מידע ביבליוגרפי

Main Authors:	Aguiar, Ygor Quadros de, Wrobel, Frédéric, Autran, Jean-Luc, García Alía, Rubén
פורמט:	Online
שפה:	אנגלית
יצא לאור:	Springer Nature 2024
נושאים:	Soft Errors from Particle to Circuits Single Event Effects in Aerospace Radiation Effects on Integrated Circuits and Systems Radiation Hardening by Process Radiation Hardening by Design RADSAGA thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TR Transport technology and trades::TRP Aerospace and aviation technology thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TT Other technologies and applied sciences::TTD Space science::TTDS Astronautics
גישה מקוונת:	ONIX_20241113_9783031717239_62
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!