Single-Event Effects, from Space to Accelerator Environments
This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different ra...
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| Natura: | Online |
| Lingua: | inglese |
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Springer Nature
2024
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| Accesso online: | ONIX_20241113_9783031717239_62 |
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| _version_ | 1869515546776567808 |
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| author | Aguiar, Ygor Quadros de Wrobel, Frédéric Autran, Jean-Luc García Alía, Rubén |
| author_browse | Aguiar, Ygor Quadros de Autran, Jean-Luc García Alía, Rubén Wrobel, Frédéric |
| author_facet | Aguiar, Ygor Quadros de Wrobel, Frédéric Autran, Jean-Luc García Alía, Rubén |
| author_sort | Aguiar, Ygor Quadros de |
| collection | Directory of Open Access Books |
| description | This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book. |
| format | Online |
| id | doab-20.500.12854ir-147808 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2024 |
| publishDateRange | 2024 |
| publishDateSort | 2024 |
| publisher | Springer Nature |
| publisherStr | Springer Nature |
| record_format | ojs |
| spelling | doab-20.500.12854ir-1478082025-09-02T05:03:08Z Single-Event Effects, from Space to Accelerator Environments Aguiar, Ygor Quadros de Wrobel, Frédéric Autran, Jean-Luc García Alía, Rubén Soft Errors from Particle to Circuits Single Event Effects in Aerospace Radiation Effects on Integrated Circuits and Systems Radiation Hardening by Process Radiation Hardening by Design RADSAGA thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TR Transport technology and trades::TRP Aerospace and aviation technology thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TT Other technologies and applied sciences::TTD Space science::TTDS Astronautics This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book. 2024-11-14T04:10:04Z 2024-11-14T04:10:04Z 2024-11-13T12:49:14Z 2025 book ONIX_20241113_9783031717239_62 https://library.oapen.org/handle/20.500.12657/94673 9783031717239 9783031717222 https://directory.doabooks.org/handle/20.500.12854/147808 eng open access image/jpeg image/jpeg n/a n/a https://library.oapen.org/bitstream/20.500.12657/94673/1/978-3-031-71723-9.pdf https://library.oapen.org/bitstream/20.500.12657/94673/1/978-3-031-71723-9.pdf Springer Nature Springer International Publishing 10.1007/978-3-031-71723-9 10.1007/978-3-031-71723-9 9fa3421d-f917-4153-b9ab-fc337c396b5a 9783031717239 9783031717222 Springer International Publishing 141 Cham open access |
| spellingShingle | Soft Errors from Particle to Circuits Single Event Effects in Aerospace Radiation Effects on Integrated Circuits and Systems Radiation Hardening by Process Radiation Hardening by Design RADSAGA thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TR Transport technology and trades::TRP Aerospace and aviation technology thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TT Other technologies and applied sciences::TTD Space science::TTDS Astronautics Aguiar, Ygor Quadros de Wrobel, Frédéric Autran, Jean-Luc García Alía, Rubén Single-Event Effects, from Space to Accelerator Environments |
| title | Single-Event Effects, from Space to Accelerator Environments |
| title_full | Single-Event Effects, from Space to Accelerator Environments |
| title_fullStr | Single-Event Effects, from Space to Accelerator Environments |
| title_full_unstemmed | Single-Event Effects, from Space to Accelerator Environments |
| title_short | Single-Event Effects, from Space to Accelerator Environments |
| title_sort | single event effects from space to accelerator environments |
| topic | Soft Errors from Particle to Circuits Single Event Effects in Aerospace Radiation Effects on Integrated Circuits and Systems Radiation Hardening by Process Radiation Hardening by Design RADSAGA thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TR Transport technology and trades::TRP Aerospace and aviation technology thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TT Other technologies and applied sciences::TTD Space science::TTDS Astronautics |
| topic_facet | Soft Errors from Particle to Circuits Single Event Effects in Aerospace Radiation Effects on Integrated Circuits and Systems Radiation Hardening by Process Radiation Hardening by Design RADSAGA thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TR Transport technology and trades::TRP Aerospace and aviation technology thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TT Other technologies and applied sciences::TTD Space science::TTDS Astronautics |
| url | ONIX_20241113_9783031717239_62 |
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