Latest Advancements in Semiconductor Materials, Devices, and Systems
The reprint Latest Advancements in Semiconductor Materials, Devices, and Systems compiles groundbreaking research from a Special Issue of Micromachines. This collection explores the forefront of semiconductor innovation, covering diverse topics such as material synthesis, advanced device architectur...
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| Materialtyp: | Online |
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| Språk: | engelska |
| Utgiven: |
MDPI - Multidisciplinary Digital Publishing Institute
2025
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| Ämnen: | |
| Länkar: | ONIX_20250220_9783725828081_442 |
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| _version_ | 1869522740767096832 |
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| collection | Directory of Open Access Books |
| description | The reprint Latest Advancements in Semiconductor Materials, Devices, and Systems compiles groundbreaking research from a Special Issue of Micromachines. This collection explores the forefront of semiconductor innovation, covering diverse topics such as material synthesis, advanced device architectures, numerical modeling, and emerging applications in electronics and optoelectronics. Aimed at researchers and industry professionals, this volume offers an in-depth perspective on the state-of-the-art developments shaping the future of semiconductor technology. |
| format | Online |
| id | doab-20.500.12854ir-153078 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2025 |
| publishDateRange | 2025 |
| publishDateSort | 2025 |
| publisher | MDPI - Multidisciplinary Digital Publishing Institute |
| publisherStr | MDPI - Multidisciplinary Digital Publishing Institute |
| record_format | ojs |
| spelling | doab-20.500.12854ir-1530782025-02-20T13:31:33Z Latest Advancements in Semiconductor Materials, Devices, and Systems Wang, Zeheng Huang, Jing-Kai GaN HEMT figure of merit coherent channel wide bandgap devices ultrawide bandgap devices silicon silicon carbide diamond power semiconductor devices GaN HEMT trap characterization methods DLTS AlGaN/GaN high electron mobility transistors (HEMTs) SiNx passivation low-pressure chemical vapor deposition (LPCVD) ohmic contact SiNx/GaN interface gate-all-around (GAA) Nanosheet FETs (NSFETs) compact model artificial neural network (ANN) TCAD simulation stacked DRAM WoW cross-process analysis methodology signal integrity integrated circuit (IC) models of integrated circuits for RF immunity behavioral simulation-conducted immunity modeling (ICIM-CI) immunity modeling electromagnetic compatibility (EMC) modeling direct power injection (DPI) X-parameters bandgap reference wide input range high-order curvature compensation temperature coefficient power amplifiers high efficiency 2.45 GHz TiO2 nanorod (NR) Al2O3 ultraviolet (UV) photodetector atomic layer deposition (ALD) n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::M Medicine and Nursing::MJ Clinical and internal medicine::MJC Diseases and disorders::MJCL Oncology The reprint Latest Advancements in Semiconductor Materials, Devices, and Systems compiles groundbreaking research from a Special Issue of Micromachines. This collection explores the forefront of semiconductor innovation, covering diverse topics such as material synthesis, advanced device architectures, numerical modeling, and emerging applications in electronics and optoelectronics. Aimed at researchers and industry professionals, this volume offers an in-depth perspective on the state-of-the-art developments shaping the future of semiconductor technology. 2025-02-20T13:31:30Z 2025-02-20T13:31:30Z 2024 book ONIX_20250220_9783725828081_442 9783725828081 9783725828074 https://directory.doabooks.org/handle/20.500.12854/153078 eng application/octet-stream Attribution 4.0 International https://mdpi.com/books/pdfview/book/10280 MDPI - Multidisciplinary Digital Publishing Institute 10.3390/books978-3-7258-2807-4 10.3390/books978-3-7258-2807-4 46cabcaa-dd94-4bfe-87b4-55023c1b36d0 9783725828081 9783725828074 200 Basel open access |
| spellingShingle | GaN HEMT figure of merit coherent channel wide bandgap devices ultrawide bandgap devices silicon silicon carbide diamond power semiconductor devices GaN HEMT trap characterization methods DLTS AlGaN/GaN high electron mobility transistors (HEMTs) SiNx passivation low-pressure chemical vapor deposition (LPCVD) ohmic contact SiNx/GaN interface gate-all-around (GAA) Nanosheet FETs (NSFETs) compact model artificial neural network (ANN) TCAD simulation stacked DRAM WoW cross-process analysis methodology signal integrity integrated circuit (IC) models of integrated circuits for RF immunity behavioral simulation-conducted immunity modeling (ICIM-CI) immunity modeling electromagnetic compatibility (EMC) modeling direct power injection (DPI) X-parameters bandgap reference wide input range high-order curvature compensation temperature coefficient power amplifiers high efficiency 2.45 GHz TiO2 nanorod (NR) Al2O3 ultraviolet (UV) photodetector atomic layer deposition (ALD) n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::M Medicine and Nursing::MJ Clinical and internal medicine::MJC Diseases and disorders::MJCL Oncology Latest Advancements in Semiconductor Materials, Devices, and Systems |
| title | Latest Advancements in Semiconductor Materials, Devices, and Systems |
| title_full | Latest Advancements in Semiconductor Materials, Devices, and Systems |
| title_fullStr | Latest Advancements in Semiconductor Materials, Devices, and Systems |
| title_full_unstemmed | Latest Advancements in Semiconductor Materials, Devices, and Systems |
| title_short | Latest Advancements in Semiconductor Materials, Devices, and Systems |
| title_sort | latest advancements in semiconductor materials devices and systems |
| topic | GaN HEMT figure of merit coherent channel wide bandgap devices ultrawide bandgap devices silicon silicon carbide diamond power semiconductor devices GaN HEMT trap characterization methods DLTS AlGaN/GaN high electron mobility transistors (HEMTs) SiNx passivation low-pressure chemical vapor deposition (LPCVD) ohmic contact SiNx/GaN interface gate-all-around (GAA) Nanosheet FETs (NSFETs) compact model artificial neural network (ANN) TCAD simulation stacked DRAM WoW cross-process analysis methodology signal integrity integrated circuit (IC) models of integrated circuits for RF immunity behavioral simulation-conducted immunity modeling (ICIM-CI) immunity modeling electromagnetic compatibility (EMC) modeling direct power injection (DPI) X-parameters bandgap reference wide input range high-order curvature compensation temperature coefficient power amplifiers high efficiency 2.45 GHz TiO2 nanorod (NR) Al2O3 ultraviolet (UV) photodetector atomic layer deposition (ALD) n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::M Medicine and Nursing::MJ Clinical and internal medicine::MJC Diseases and disorders::MJCL Oncology |
| topic_facet | GaN HEMT figure of merit coherent channel wide bandgap devices ultrawide bandgap devices silicon silicon carbide diamond power semiconductor devices GaN HEMT trap characterization methods DLTS AlGaN/GaN high electron mobility transistors (HEMTs) SiNx passivation low-pressure chemical vapor deposition (LPCVD) ohmic contact SiNx/GaN interface gate-all-around (GAA) Nanosheet FETs (NSFETs) compact model artificial neural network (ANN) TCAD simulation stacked DRAM WoW cross-process analysis methodology signal integrity integrated circuit (IC) models of integrated circuits for RF immunity behavioral simulation-conducted immunity modeling (ICIM-CI) immunity modeling electromagnetic compatibility (EMC) modeling direct power injection (DPI) X-parameters bandgap reference wide input range high-order curvature compensation temperature coefficient power amplifiers high efficiency 2.45 GHz TiO2 nanorod (NR) Al2O3 ultraviolet (UV) photodetector atomic layer deposition (ALD) n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::M Medicine and Nursing::MJ Clinical and internal medicine::MJC Diseases and disorders::MJCL Oncology |
| url | ONIX_20250220_9783725828081_442 |