Atomic Force Microscopy

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alt...

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collection Directory of Open Access Books
description With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
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institution Directory of Open Access Books
language eng
publishDate 2021
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spelling doab-20.500.12854ir-658732024-04-05T12:40:36Z Atomic Force Microscopy Bellitto, Victor Electrochemistry & magnetochemistry thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development. 2021-04-20T15:28:11Z 2021-04-20T15:28:11Z 2012 book ONIX_20210420_9789535104148_1231 9789535104148 9789535149873 https://directory.doabooks.org/handle/20.500.12854/65873 eng image/jpeg n/a https://www.intechopen.com/books https://mts.intechopen.com/storage/books/2282/authors_book/authors_book.pdf IntechOpen IntechOpen 10.5772/2673 10.5772/2673 78a36484-2c0c-47cb-ad67-2b9f5cd4a8f6 9789535104148 9789535149873 IntechOpen 270 open access
spellingShingle Electrochemistry & magnetochemistry
thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry
Atomic Force Microscopy
title Atomic Force Microscopy
title_full Atomic Force Microscopy
title_fullStr Atomic Force Microscopy
title_full_unstemmed Atomic Force Microscopy
title_short Atomic Force Microscopy
title_sort atomic force microscopy
topic Electrochemistry & magnetochemistry
thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry
topic_facet Electrochemistry & magnetochemistry
thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry
url ONIX_20210420_9789535104148_1231