Scanning Probe Microscopy

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization...

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Manylion Llyfryddiaeth
Fformat: Online
Iaith:Saesneg
Cyhoeddwyd: IntechOpen 2021
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Mynediad Ar-lein:ONIX_20210420_9789535105763_1409
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collection Directory of Open Access Books
description Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.
format Online
id doab-20.500.12854ir-66051
institution Directory of Open Access Books
language eng
publishDate 2021
publishDateRange 2021
publishDateSort 2021
publisher IntechOpen
publisherStr IntechOpen
record_format ojs
spelling doab-20.500.12854ir-660512024-04-05T12:40:34Z Scanning Probe Microscopy Nalladega, Vijay Electrochemistry & magnetochemistry thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy. 2021-04-20T15:32:48Z 2021-04-20T15:32:48Z 2012 book ONIX_20210420_9789535105763_1409 9789535105763 9789535149989 https://directory.doabooks.org/handle/20.500.12854/66051 eng image/jpeg n/a https://www.intechopen.com/books https://mts.intechopen.com/storage/books/2264/authors_book/authors_book.pdf IntechOpen IntechOpen 10.5772/2653 10.5772/2653 78a36484-2c0c-47cb-ad67-2b9f5cd4a8f6 9789535105763 9789535149989 IntechOpen 256 open access
spellingShingle Electrochemistry & magnetochemistry
thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry
Scanning Probe Microscopy
title Scanning Probe Microscopy
title_full Scanning Probe Microscopy
title_fullStr Scanning Probe Microscopy
title_full_unstemmed Scanning Probe Microscopy
title_short Scanning Probe Microscopy
title_sort scanning probe microscopy
topic Electrochemistry & magnetochemistry
thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry
topic_facet Electrochemistry & magnetochemistry
thema EDItEUR::P Mathematics and Science::PN Chemistry::PNF Analytical chemistry::PNFS Spectrum analysis, spectrochemistry, mass spectrometry
url ONIX_20210420_9789535105763_1409