High-Efficiency Crystalline Silicon Solar Cells

This book is composed of 6 papers. The first paper reports a novel technique for the selective emitter formation by controlling the surface morphology of Si wafers. Selective emitter (SE) technology has attracted renewed attention in the Si solar cell industry to achieve an improved conversion effic...

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description This book is composed of 6 papers. The first paper reports a novel technique for the selective emitter formation by controlling the surface morphology of Si wafers. Selective emitter (SE) technology has attracted renewed attention in the Si solar cell industry to achieve an improved conversion efficiency of passivated-emitter rear-contact (PERC) cells. In the second paper, the temperature dependence of the parameters was compared through the PERC of the industrial-scale solar cells. As a result of their analysis, PERC cells showed different temperature dependence for the fill factor loss as temperatures rose. The third paper reports the effects of carrier selective front contact layer and defect state of hydrogenated amorphous silicon passivation layer/n-type crystalline silicon interface. The results demonstrated the effects of band offset determined by band bending at the interface of the passivation layer and carrier selective front contact layer. In addition, the nc-SiOx: H CSFC layer not only reduces parasitic absorption loss but also has a tunneling effect and field-effect passivation. The fourth paper reports excimer laser annealing of hydrogenated amorphous silicon film for TOPCon solar cell application. This paper analyzes the crystallization of a-Si:H via excimer laser annealing (ELA) and compared this process with conventional thermal annealing. The fifth paper reports the contact mechanism between Ag–Al and Si and the change in contact resistance (Rc) by varying the firing profile. Rc was measured by varying the belt speed and peak temperature of the fast-firing furnace. The sixth paper reports a silicon tandem heterojunction solar cell based on a ZnO/Cu2O subcell and a c-Si bottom subcell using electro-optical numerical modeling. The buffer layer affinity and mobility together with a low conduction band offset for the heterojunction are discussed, as well as spectral properties of the device model.
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publishDate 2021
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publisher MDPI - Multidisciplinary Digital Publishing Institute
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spelling doab-20.500.12854ir-682672024-04-11T15:11:26Z High-Efficiency Crystalline Silicon Solar Cells Cho, Eun-Chel Lee, Hae-Seok fill factor loss analysis double-diode model PERC temperature dependence recombination current density parasitic resistance carrier selective contact rear emitter heterojunction passivation crystallinity thermal annealing excimer laser annealing amorphous hydrogenated silicon film metallization contact formation Ag/Al paste p+ emitter N-type bifacial solar cells silicon tandem heterojunction solar cell N-doped Cu2O absorber layer Al:ZnO (AZO) numerical electro-optical modeling scanning electron microscopy (SEM) atomic force microscopy (AFM) X-ray diffraction (XRD) spectroscopic ellipsometry (SE) Fourier-transform infrared (FTIR) spectroscopy degradation degree failure rate selective emitter surface morphology doping process solar cell thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology This book is composed of 6 papers. The first paper reports a novel technique for the selective emitter formation by controlling the surface morphology of Si wafers. Selective emitter (SE) technology has attracted renewed attention in the Si solar cell industry to achieve an improved conversion efficiency of passivated-emitter rear-contact (PERC) cells. In the second paper, the temperature dependence of the parameters was compared through the PERC of the industrial-scale solar cells. As a result of their analysis, PERC cells showed different temperature dependence for the fill factor loss as temperatures rose. The third paper reports the effects of carrier selective front contact layer and defect state of hydrogenated amorphous silicon passivation layer/n-type crystalline silicon interface. The results demonstrated the effects of band offset determined by band bending at the interface of the passivation layer and carrier selective front contact layer. In addition, the nc-SiOx: H CSFC layer not only reduces parasitic absorption loss but also has a tunneling effect and field-effect passivation. The fourth paper reports excimer laser annealing of hydrogenated amorphous silicon film for TOPCon solar cell application. This paper analyzes the crystallization of a-Si:H via excimer laser annealing (ELA) and compared this process with conventional thermal annealing. The fifth paper reports the contact mechanism between Ag–Al and Si and the change in contact resistance (Rc) by varying the firing profile. Rc was measured by varying the belt speed and peak temperature of the fast-firing furnace. The sixth paper reports a silicon tandem heterojunction solar cell based on a ZnO/Cu2O subcell and a c-Si bottom subcell using electro-optical numerical modeling. The buffer layer affinity and mobility together with a low conduction band offset for the heterojunction are discussed, as well as spectral properties of the device model. 2021-05-01T15:05:47Z 2021-05-01T15:05:47Z 2021 book ONIX_20210501_9783039436293_10 9783039436293 9783039436309 https://directory.doabooks.org/handle/20.500.12854/68267 eng application/octet-stream Attribution 4.0 International https://mdpi.com/books/pdfview/book/3264 https://mdpi.com/books/pdfview/book/3264 MDPI - Multidisciplinary Digital Publishing Institute 10.3390/books978-3-03943-630-9 10.3390/books978-3-03943-630-9 46cabcaa-dd94-4bfe-87b4-55023c1b36d0 9783039436293 9783039436309 90 Basel, Switzerland open access
spellingShingle fill factor loss analysis
double-diode model
PERC
temperature dependence
recombination current density
parasitic resistance
carrier selective contact
rear emitter heterojunction
passivation
crystallinity
thermal annealing
excimer laser annealing
amorphous hydrogenated silicon film
metallization
contact formation
Ag/Al paste
p+ emitter
N-type bifacial solar cells
silicon tandem heterojunction solar cell
N-doped Cu2O absorber layer
Al:ZnO (AZO)
numerical electro-optical modeling
scanning electron microscopy (SEM)
atomic force microscopy (AFM)
X-ray diffraction (XRD)
spectroscopic ellipsometry (SE)
Fourier-transform infrared (FTIR) spectroscopy
degradation degree
failure rate
selective emitter
surface morphology
doping process
solar cell
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
High-Efficiency Crystalline Silicon Solar Cells
title High-Efficiency Crystalline Silicon Solar Cells
title_full High-Efficiency Crystalline Silicon Solar Cells
title_fullStr High-Efficiency Crystalline Silicon Solar Cells
title_full_unstemmed High-Efficiency Crystalline Silicon Solar Cells
title_short High-Efficiency Crystalline Silicon Solar Cells
title_sort high efficiency crystalline silicon solar cells
topic fill factor loss analysis
double-diode model
PERC
temperature dependence
recombination current density
parasitic resistance
carrier selective contact
rear emitter heterojunction
passivation
crystallinity
thermal annealing
excimer laser annealing
amorphous hydrogenated silicon film
metallization
contact formation
Ag/Al paste
p+ emitter
N-type bifacial solar cells
silicon tandem heterojunction solar cell
N-doped Cu2O absorber layer
Al:ZnO (AZO)
numerical electro-optical modeling
scanning electron microscopy (SEM)
atomic force microscopy (AFM)
X-ray diffraction (XRD)
spectroscopic ellipsometry (SE)
Fourier-transform infrared (FTIR) spectroscopy
degradation degree
failure rate
selective emitter
surface morphology
doping process
solar cell
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
topic_facet fill factor loss analysis
double-diode model
PERC
temperature dependence
recombination current density
parasitic resistance
carrier selective contact
rear emitter heterojunction
passivation
crystallinity
thermal annealing
excimer laser annealing
amorphous hydrogenated silicon film
metallization
contact formation
Ag/Al paste
p+ emitter
N-type bifacial solar cells
silicon tandem heterojunction solar cell
N-doped Cu2O absorber layer
Al:ZnO (AZO)
numerical electro-optical modeling
scanning electron microscopy (SEM)
atomic force microscopy (AFM)
X-ray diffraction (XRD)
spectroscopic ellipsometry (SE)
Fourier-transform infrared (FTIR) spectroscopy
degradation degree
failure rate
selective emitter
surface morphology
doping process
solar cell
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
url ONIX_20210501_9783039436293_10