Style de citation APA (7e éd.)
Geydt, P., Dunaevskiy, M. S., & Lähderanta, E. (2021). Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires. InTechOpen.
Style de citation Chicago (17e éd.)
Geydt, Pavel, M. S. Dunaevskiy, et Erkki Lähderanta. Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires. InTechOpen, 2021.
Style de citation MLA (9e éd.)
Geydt, Pavel, et al. Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires. InTechOpen, 2021.
Attention : ces citations peuvent ne pas être correctes à 100%.