Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III–V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...

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Bibliographic Details

Main Authors:	Geydt, Pavel, Dunaevskiy, M. S., Lähderanta, Erkki
Format:	Online
Language:	English
Published:	InTechOpen 2021
Subjects:	scanning probe microscopy, AFM, PFM, current-voltage characteristics, Young’s modulus thema EDItEUR::P Mathematics and Science::PH Physics::PHF Materials / States of matter::PHFC Condensed matter physics (liquid state and solid state physics)
Online Access:	ONIX_20210602_10.5772/intechopen.68162_335
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