Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III–V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...

תיאור מלא

מידע ביבליוגרפי

Main Authors:	Geydt, Pavel, Dunaevskiy, M. S., Lähderanta, Erkki
פורמט:	Online
שפה:	אנגלית
יצא לאור:	InTechOpen 2021
נושאים:	scanning probe microscopy, AFM, PFM, current-voltage characteristics, Young’s modulus thema EDItEUR::P Mathematics and Science::PH Physics::PHF Materials / States of matter::PHFC Condensed matter physics (liquid state and solid state physics)
גישה מקוונת:	ONIX_20210602_10.5772/intechopen.68162_335
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!