Chapter Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires

In this chapter, three types of phenomena (electrical, mechanical, and electromechanical) that can be investigated in individual III–V semiconductor nanowires with scanning probe microscope are presented. Transport measurements in GaAs nanowires based on stable electric connection provided opportuni...

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Detaylı Bibliyografya
Asıl Yazarlar:	Geydt, Pavel, Dunaevskiy, M. S., Lähderanta, Erkki
Materyal Türü:	Online
Dil:	İngilizce
Baskı/Yayın Bilgisi:	InTechOpen 2021
Konular:	scanning probe microscopy, AFM, PFM, current-voltage characteristics, Young’s modulus thema EDItEUR::P Mathematics and Science::PH Physics::PHF Materials / States of matter::PHFC Condensed matter physics (liquid state and solid state physics)
Online Erişim:	ONIX_20210602_10.5772/intechopen.68162_335
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

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