Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability

This chapter deals with digital method of calibration for analog integrated circuits as a means of extending its lifetime and reliability, which consequently affects the reliability the analog electronic system as a whole. The proposed method can compensate for drift in circuit’s electrical paramete...

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Main Authors: Michal, Sovcik, Lukas, Nagy, Viera, Stopjakova, Daniel, Arbet
Formato: Online
Idioma:inglés
Publicado: InTechOpen 2021
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Acceso en liña:ONIX_20210602_10.5772/intechopen.96609_501
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author Michal, Sovcik
Lukas, Nagy
Viera, Stopjakova
Daniel, Arbet
author_browse Daniel, Arbet
Lukas, Nagy
Michal, Sovcik
Viera, Stopjakova
author_facet Michal, Sovcik
Lukas, Nagy
Viera, Stopjakova
Daniel, Arbet
author_sort Michal, Sovcik
collection Directory of Open Access Books
description This chapter deals with digital method of calibration for analog integrated circuits as a means of extending its lifetime and reliability, which consequently affects the reliability the analog electronic system as a whole. The proposed method can compensate for drift in circuit’s electrical parameters, which occurs either in a long term due to aging and electrical stress or it is rather more acute, being caused by process, voltage and temperature variations. The chapter reveals the implementation of ultra-low voltage on-chip system of digitally calibrated variable-gain amplifier (VGA), fabricated in CMOS 130 nm technology. It operates reliably under supply voltage of 600 mV with 10% variation, in temperature range from − 20 ° C to 85 ° C . Simulations suggest that the system will preserve its parameters for at least 10 years of operation. Experimental verification over 10 packaged integrated circuit (IC) samples shows the input offset voltage of VGA is suppressed in range of 13 μV to 167 μV . With calibration the VGA closely meets its nominally designed essential specifications as voltage gain or bandwidth. Digital calibration is comprehensively compared to its widely used alternative, Chopper stabilization through its implementation for the same VGA.
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language eng
publishDate 2021
publishDateRange 2021
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spelling doab-20.500.12854ir-705162025-08-13T14:11:58Z Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability Michal, Sovcik Lukas, Nagy Viera, Stopjakova Daniel, Arbet on-chip digital calibration, PVT variations, aging compensation, reliability, input offset voltage, continuous operation, ultra-low voltage thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general This chapter deals with digital method of calibration for analog integrated circuits as a means of extending its lifetime and reliability, which consequently affects the reliability the analog electronic system as a whole. The proposed method can compensate for drift in circuit’s electrical parameters, which occurs either in a long term due to aging and electrical stress or it is rather more acute, being caused by process, voltage and temperature variations. The chapter reveals the implementation of ultra-low voltage on-chip system of digitally calibrated variable-gain amplifier (VGA), fabricated in CMOS 130 nm technology. It operates reliably under supply voltage of 600 mV with 10% variation, in temperature range from − 20 ° C to 85 ° C . Simulations suggest that the system will preserve its parameters for at least 10 years of operation. Experimental verification over 10 packaged integrated circuit (IC) samples shows the input offset voltage of VGA is suppressed in range of 13 μV to 167 μV . With calibration the VGA closely meets its nominally designed essential specifications as voltage gain or bandwidth. Digital calibration is comprehensively compared to its widely used alternative, Chopper stabilization through its implementation for the same VGA. 2021-02-10T12:58:18Z 2021-06-02T10:13:45Z 2021 chapter ONIX_20210602_10.5772/intechopen.96609_501 https://library.oapen.org/handle/20.500.12657/49387 https://directory.doabooks.org/handle/20.500.12854/70516 eng open access image/jpeg image/jpeg image/jpeg n/a n/a n/a https://library.oapen.org/bitstream/20.500.12657/49387/1/75609.pdf https://library.oapen.org/bitstream/20.500.12657/49387/1/75609.pdf https://library.oapen.org/bitstream/20.500.12657/49387/1/75609.pdf InTechOpen 10.5772/intechopen.96609 10.5772/intechopen.96609 035ecc65-6737-43cf-a13a-6bdf67ce01f4 open access
spellingShingle on-chip digital calibration, PVT variations, aging compensation, reliability, input offset voltage, continuous operation, ultra-low voltage
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general
Michal, Sovcik
Lukas, Nagy
Viera, Stopjakova
Daniel, Arbet
Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability
title Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability
title_full Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability
title_fullStr Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability
title_full_unstemmed Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability
title_short Chapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability
title_sort chapter digital on chip calibration of analog systems towards enhanced reliability
topic on-chip digital calibration, PVT variations, aging compensation, reliability, input offset voltage, continuous operation, ultra-low voltage
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general
topic_facet on-chip digital calibration, PVT variations, aging compensation, reliability, input offset voltage, continuous operation, ultra-low voltage
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBC Engineering: general
url ONIX_20210602_10.5772/intechopen.96609_501
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