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High-Density Solid-State Memory Devices and Technologies

This Special Issue aims to examine high-density solid-state memory devices and technologies from various standpoints in an attempt to foster their continuous success in the future. Considering that broadening of the range of applications will likely offer different types of solid-state memories thei...

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Gespeichert in:
Format: Online
Sprache:Englisch
Veröffentlicht: MDPI - Multidisciplinary Digital Publishing Institute 2022
Schlagworte:
resistive switching memory
in-memory computing
crosspoint array
artificial intelligence
deep learning
dielectric
RTN
TAT
Wiener–Khinchin
transient analysis
phonon
surface roughness
spectral index
power spectrum
program suspend
3D NAND Flash
Solid State Drives
MOSFET
low-frequency noise
random telegraph noise
evaluation method
array test pattern
STT-MRAM
spintronics
CoFeB
composite free layer
low power electronics
NAND Flash memory
endurance
reliability
oxide trapped charge
artificial neural networks
neuromorphic computing
NOR Flash memory arrays
program noise
pulse-width modulation
3D NAND
floating gate cell
charge-trap cell
CMOS under array
bumpless
TSV
WOW
COW
BBCube
bandwidth
yield
power consumption
thermal management
n/a
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
Online-Zugang:ONIX_20220506_9783036533599_182
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Zusammenfassung:This Special Issue aims to examine high-density solid-state memory devices and technologies from various standpoints in an attempt to foster their continuous success in the future. Considering that broadening of the range of applications will likely offer different types of solid-state memories their chance in the spotlight, the Special Issue is not focused on a specific storage solution but rather embraces all the most relevant solid-state memory devices and technologies currently on stage. Even the subjects dealt with in this Special Issue are widespread, ranging from process and design issues/innovations to the experimental and theoretical analysis of the operation and from the performance and reliability of memory devices and arrays to the exploitation of solid-state memories to pursue new computing paradigms.

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