Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...
Uloženo v:
| Médium: | Online |
|---|---|
| Jazyk: | angličtina |
| Vydáno: |
IntechOpen
2022
|
| Témata: | |
| On-line přístup: | ONIX_20220727_9781839682308_7 |
| Tagy: |
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|