Recent Advances in Thin Film Electronic Devices
This reprint is a collection of the papers from the Special Issue “Recent Advances in Thin Film Electronic Devices” in Micromachines. In this reprrint, 1 editorial and 11 original papers about recent advances in the research and development of thin film electronic devices are included. Specifically,...
Furkejuvvon:
| Materiálatiipa: | Online |
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| Giella: | eaŋgalasgiella |
| Almmustuhtton: |
MDPI - Multidisciplinary Digital Publishing Institute
2022
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| Fáttát: | |
| Liŋkkat: | ONIX_20221117_9783036552934_39 |
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| _version_ | 1869526001957994496 |
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| collection | Directory of Open Access Books |
| description | This reprint is a collection of the papers from the Special Issue “Recent Advances in Thin Film Electronic Devices” in Micromachines. In this reprrint, 1 editorial and 11 original papers about recent advances in the research and development of thin film electronic devices are included. Specifically, three research fields are covered: device fundamentals (5 papers), fabrication processes (5 papers), and testing methods (1 paper). The experimental data, simulation results, and theoretical analysis presented in this reprint should benefit those researchers in flat panel displays, flat panel sensors, energy devices, memories, and so on. |
| format | Online |
| id | doab-20.500.12854ir-93782 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2022 |
| publishDateRange | 2022 |
| publishDateSort | 2022 |
| publisher | MDPI - Multidisciplinary Digital Publishing Institute |
| publisherStr | MDPI - Multidisciplinary Digital Publishing Institute |
| record_format | ojs |
| spelling | doab-20.500.12854ir-937822024-04-11T15:10:48Z Recent Advances in Thin Film Electronic Devices Dong, Chengyuan solution method laser treatment active layer metal oxide semiconductor thin film transistor amorphous InGaZnO (a-IGZO) thin-film transistor (TFT) positive bias stress (PBS) annealing atmosphere oxygen vacancy foreign material laser sensor area charge-coupled device color filter thin-film transistor annealing dielectric gate-all-around (GAA) hot-carrier injection (HCI) power consumption punch-through reliability logic transistors artificial synapse long-term synaptic plasticity short-term synaptic plasticity halide perovskite flexible electronics wrinkling shape-memory polymer lift-off hybrid structure multilayer conductive films wearable electronics band-to-band tunneling epitaxial growth ground plane region gate-all-around field-effect-transistors (GAA FETs) nanosheet FETs (NS FETs) parasitic channel leakage a-IGZO TFTs sub-gap states nitrogen-doping numerical simulation stability zinc oxide films solution-processing electronics Schottky barrier diodes semiconductor defects polarization filter photonic crystal fiber surface plasmon resonance plasmonic sensor silver electrodeposition ITO morphology thin films TiO2 n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology thema EDItEUR::K Economics, Finance, Business and Management::KN Industry and industrial studies::KNB Energy industries and utilities This reprint is a collection of the papers from the Special Issue “Recent Advances in Thin Film Electronic Devices” in Micromachines. In this reprrint, 1 editorial and 11 original papers about recent advances in the research and development of thin film electronic devices are included. Specifically, three research fields are covered: device fundamentals (5 papers), fabrication processes (5 papers), and testing methods (1 paper). The experimental data, simulation results, and theoretical analysis presented in this reprint should benefit those researchers in flat panel displays, flat panel sensors, energy devices, memories, and so on. 2022-11-17T16:24:16Z 2022-11-17T16:24:16Z 2022 book ONIX_20221117_9783036552934_39 9783036552934 9783036552941 https://directory.doabooks.org/handle/20.500.12854/93782 eng image/jpeg Attribution 4.0 International https://mdpi.com/books/pdfview/book/6210 https://mdpi.com/books/pdfview/book/6210 MDPI - Multidisciplinary Digital Publishing Institute 10.3390/books978-3-0365-5293-4 10.3390/books978-3-0365-5293-4 46cabcaa-dd94-4bfe-87b4-55023c1b36d0 9783036552934 9783036552941 152 Basel open access |
| spellingShingle | solution method laser treatment active layer metal oxide semiconductor thin film transistor amorphous InGaZnO (a-IGZO) thin-film transistor (TFT) positive bias stress (PBS) annealing atmosphere oxygen vacancy foreign material laser sensor area charge-coupled device color filter thin-film transistor annealing dielectric gate-all-around (GAA) hot-carrier injection (HCI) power consumption punch-through reliability logic transistors artificial synapse long-term synaptic plasticity short-term synaptic plasticity halide perovskite flexible electronics wrinkling shape-memory polymer lift-off hybrid structure multilayer conductive films wearable electronics band-to-band tunneling epitaxial growth ground plane region gate-all-around field-effect-transistors (GAA FETs) nanosheet FETs (NS FETs) parasitic channel leakage a-IGZO TFTs sub-gap states nitrogen-doping numerical simulation stability zinc oxide films solution-processing electronics Schottky barrier diodes semiconductor defects polarization filter photonic crystal fiber surface plasmon resonance plasmonic sensor silver electrodeposition ITO morphology thin films TiO2 n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology thema EDItEUR::K Economics, Finance, Business and Management::KN Industry and industrial studies::KNB Energy industries and utilities Recent Advances in Thin Film Electronic Devices |
| title | Recent Advances in Thin Film Electronic Devices |
| title_full | Recent Advances in Thin Film Electronic Devices |
| title_fullStr | Recent Advances in Thin Film Electronic Devices |
| title_full_unstemmed | Recent Advances in Thin Film Electronic Devices |
| title_short | Recent Advances in Thin Film Electronic Devices |
| title_sort | recent advances in thin film electronic devices |
| topic | solution method laser treatment active layer metal oxide semiconductor thin film transistor amorphous InGaZnO (a-IGZO) thin-film transistor (TFT) positive bias stress (PBS) annealing atmosphere oxygen vacancy foreign material laser sensor area charge-coupled device color filter thin-film transistor annealing dielectric gate-all-around (GAA) hot-carrier injection (HCI) power consumption punch-through reliability logic transistors artificial synapse long-term synaptic plasticity short-term synaptic plasticity halide perovskite flexible electronics wrinkling shape-memory polymer lift-off hybrid structure multilayer conductive films wearable electronics band-to-band tunneling epitaxial growth ground plane region gate-all-around field-effect-transistors (GAA FETs) nanosheet FETs (NS FETs) parasitic channel leakage a-IGZO TFTs sub-gap states nitrogen-doping numerical simulation stability zinc oxide films solution-processing electronics Schottky barrier diodes semiconductor defects polarization filter photonic crystal fiber surface plasmon resonance plasmonic sensor silver electrodeposition ITO morphology thin films TiO2 n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology thema EDItEUR::K Economics, Finance, Business and Management::KN Industry and industrial studies::KNB Energy industries and utilities |
| topic_facet | solution method laser treatment active layer metal oxide semiconductor thin film transistor amorphous InGaZnO (a-IGZO) thin-film transistor (TFT) positive bias stress (PBS) annealing atmosphere oxygen vacancy foreign material laser sensor area charge-coupled device color filter thin-film transistor annealing dielectric gate-all-around (GAA) hot-carrier injection (HCI) power consumption punch-through reliability logic transistors artificial synapse long-term synaptic plasticity short-term synaptic plasticity halide perovskite flexible electronics wrinkling shape-memory polymer lift-off hybrid structure multilayer conductive films wearable electronics band-to-band tunneling epitaxial growth ground plane region gate-all-around field-effect-transistors (GAA FETs) nanosheet FETs (NS FETs) parasitic channel leakage a-IGZO TFTs sub-gap states nitrogen-doping numerical simulation stability zinc oxide films solution-processing electronics Schottky barrier diodes semiconductor defects polarization filter photonic crystal fiber surface plasmon resonance plasmonic sensor silver electrodeposition ITO morphology thin films TiO2 n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology thema EDItEUR::K Economics, Finance, Business and Management::KN Industry and industrial studies::KNB Energy industries and utilities |
| url | ONIX_20221117_9783036552934_39 |