Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity

Ever-increasing bandwidth demand, growing system complexity and cost pressure require to implement smart consumer devices with Analog Mixed Signal (AMS) Systems on Chip (SoCs) that are manufactured in state of the art Ultra Deep Sub-Micron (UDSM) CMOS semiconductor technologies. Continuous-Time (CT)...

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Главный автор: Zeller, Sebastian
Формат: Online
Язык:английский
Опубликовано: FAU University Press 2025
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Online-ссылка:ONIX_20250828T094736_9783961470778_45
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author Zeller, Sebastian
author_browse Zeller, Sebastian
author_facet Zeller, Sebastian
author_sort Zeller, Sebastian
collection Directory of Open Access Books
description Ever-increasing bandwidth demand, growing system complexity and cost pressure require to implement smart consumer devices with Analog Mixed Signal (AMS) Systems on Chip (SoCs) that are manufactured in state of the art Ultra Deep Sub-Micron (UDSM) CMOS semiconductor technologies. Continuous-Time (CT)- ∑Δ -Analog-to-Digital Converters (ADCs) have become an important interface building block of these SoCs as they provide an excellent compromise of dynamic range, bandwidth and power dissipation. These properties made CT-∑Δ-ADCs the preferred choice for radio interfaces in smartphones. However, efforts to further reduce the area and power consumption of this class of data converters are needed for future mobile devices such as wearable computers and smart sensor interfaces for the Internet of Things (IoT) that require a long battery lifetime and low production cost despite high complexity. Moreover, this improvement has to be achieved under steadily degrading properties of analog components due to shrinking feature size in digital CMOS technologies. In this work, several novel design techniques that reduce the chip size and power consumption and improve the performance and clock jitter robustness of CT-∑Δ-ADCs on architectural and transistor level are proposed with an emphasis on UDSM CMOS implementations. Two testchips have been designed and manufactured to prove these concepts: A robust mostly-analog ninth order single-bit CT-∑Δ-ADC with a very high Maximum Stable Amplitude (MSA) as a first test vehicle and finally a mostly-digital 0:039 mm2, 1:82 mW third order CT-∑Δ-ADC in 65 nm CMOS with 10 MHz bandwidth and 68:6 dB Peak Signal to Noise and Distortion Ratio (SNDRp). Using a minimalistic active analog section that consists of only ten inverters, this second testchip is one of the most compact and powerefficient wideband CT-∑Δ -ADCs published so far.
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spelling doab-20.500.12854ir-1662732025-10-16T13:08:46Z Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity Zeller, Sebastian System-on-Chip CMOS-Schaltung CMOS Aktives RC-Filter Mixed-Signal-Schaltung Jitter-Effekt Sigma-Delta-Wandler thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes Ever-increasing bandwidth demand, growing system complexity and cost pressure require to implement smart consumer devices with Analog Mixed Signal (AMS) Systems on Chip (SoCs) that are manufactured in state of the art Ultra Deep Sub-Micron (UDSM) CMOS semiconductor technologies. Continuous-Time (CT)- ∑Δ -Analog-to-Digital Converters (ADCs) have become an important interface building block of these SoCs as they provide an excellent compromise of dynamic range, bandwidth and power dissipation. These properties made CT-∑Δ-ADCs the preferred choice for radio interfaces in smartphones. However, efforts to further reduce the area and power consumption of this class of data converters are needed for future mobile devices such as wearable computers and smart sensor interfaces for the Internet of Things (IoT) that require a long battery lifetime and low production cost despite high complexity. Moreover, this improvement has to be achieved under steadily degrading properties of analog components due to shrinking feature size in digital CMOS technologies. In this work, several novel design techniques that reduce the chip size and power consumption and improve the performance and clock jitter robustness of CT-∑Δ-ADCs on architectural and transistor level are proposed with an emphasis on UDSM CMOS implementations. Two testchips have been designed and manufactured to prove these concepts: A robust mostly-analog ninth order single-bit CT-∑Δ-ADC with a very high Maximum Stable Amplitude (MSA) as a first test vehicle and finally a mostly-digital 0:039 mm2, 1:82 mW third order CT-∑Δ-ADC in 65 nm CMOS with 10 MHz bandwidth and 68:6 dB Peak Signal to Noise and Distortion Ratio (SNDRp). Using a minimalistic active analog section that consists of only ten inverters, this second testchip is one of the most compact and powerefficient wideband CT-∑Δ -ADCs published so far. 2025-08-29T05:08:40Z 2025-08-29T05:08:40Z 2025-08-28T08:00:25Z 2017 book ONIX_20250828T094736_9783961470778_45 https://library.oapen.org/handle/20.500.12657/105801 9783961470778 9783961470761 https://directory.doabooks.org/handle/20.500.12854/166273 eng FAU Forschungen : Reihe B open access image/jpeg image/jpeg n/a n/a https://library.oapen.org/bitstream/20.500.12657/105801/1/9783961470778.pdf https://library.oapen.org/bitstream/20.500.12657/105801/1/9783961470778.pdf FAU University Press 10.25593/978-3-96147-077-8 10.25593/978-3-96147-077-8 2c600dea-eece-4066-87be-da335e323fdb 9783961470778 9783961470761 AG Universitätsverlage 197 Erlangen open access
spellingShingle System-on-Chip
CMOS-Schaltung
CMOS
Aktives RC-Filter
Mixed-Signal-Schaltung
Jitter-Effekt
Sigma-Delta-Wandler
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes
Zeller, Sebastian
Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity
title Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity
title_full Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity
title_fullStr Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity
title_full_unstemmed Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity
title_short Wide-Bandwidth Single-Bit Continuous-Time-Sigma-Delta-Modulation for Area- and Power-Efficient A/D Conversion with Low Jitter Sensitivity
title_sort wide bandwidth single bit continuous time sigma delta modulation for area and power efficient a d conversion with low jitter sensitivity
topic System-on-Chip
CMOS-Schaltung
CMOS
Aktives RC-Filter
Mixed-Signal-Schaltung
Jitter-Effekt
Sigma-Delta-Wandler
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes
topic_facet System-on-Chip
CMOS-Schaltung
CMOS
Aktives RC-Filter
Mixed-Signal-Schaltung
Jitter-Effekt
Sigma-Delta-Wandler
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes
url ONIX_20250828T094736_9783961470778_45
work_keys_str_mv AT zellersebastian widebandwidthsinglebitcontinuoustimesigmadeltamodulationforareaandpowerefficientadconversionwithlowjittersensitivity