Electron Diffraction and Structural Imaging II
This Reprint continues to showcase the advances of electron diffraction (ED) and structural imaging as powerful methods for structural science. Enabled by Cs correctors, direct detection cameras, beam precession, 4DSTEM, and 3DED, these approaches now resolve structures of nanocrystals, beam-sensiti...
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| フォーマット: | Online |
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| 言語: | 英語 |
| 出版事項: |
MDPI - Multidisciplinary Digital Publishing Institute
2026
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| 主題: | |
| オンライン･アクセス: | ONIX_20260416T142754_9783725853618_3 |
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| _version_ | 1869528213911240704 |
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| collection | Directory of Open Access Books |
| description | This Reprint continues to showcase the advances of electron diffraction (ED) and structural imaging as powerful methods for structural science. Enabled by Cs correctors, direct detection cameras, beam precession, 4DSTEM, and 3DED, these approaches now resolve structures of nanocrystals, beam-sensitive compounds, and complex systems that are inaccessible to conventional X-ray methods. The second volume brings together nine contributions spanning organic charge-transfer co-crystals, graphene bilayers, chiral MOFs, amorphous silica films, perovskite thin films, additively manufactured alloys, lithium-ion cathodes, and zeolites. Featured studies include the precession-assisted 3DED of donor–acceptor systems, orientation mechanisms in graphene layers, absolute structural determination and enantiomorph distinction in chiral frameworks, and precession and energy-filtering effects on electron reduced density function analysis of amorphous materials. Methodological advances highlight scanning precession electron tomography for structural analysis of thin-film regions down to 10 nm and best practices for 3DED workflows, while applications address grain boundary engineering in AlSi10Mg alloys, cathode–electrolyte interphase formation in NMC811, and the first complete structure determination of zeolite ECR-1. |
| format | Online |
| id | doab-20.500.12854ir-174698 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2026 |
| publishDateRange | 2026 |
| publishDateSort | 2026 |
| publisher | MDPI - Multidisciplinary Digital Publishing Institute |
| publisherStr | MDPI - Multidisciplinary Digital Publishing Institute |
| record_format | ojs |
| spelling | doab-20.500.12854ir-1746982026-04-16T16:01:40Z Electron Diffraction and Structural Imaging II Das, Partha Pratim Ponce-Pedraza, Arturo Mugnaioli, Enrico Nicolopoulos, Stavros Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::G Reference, Information and Interdisciplinary subjects::GP Research and information: general This Reprint continues to showcase the advances of electron diffraction (ED) and structural imaging as powerful methods for structural science. Enabled by Cs correctors, direct detection cameras, beam precession, 4DSTEM, and 3DED, these approaches now resolve structures of nanocrystals, beam-sensitive compounds, and complex systems that are inaccessible to conventional X-ray methods. The second volume brings together nine contributions spanning organic charge-transfer co-crystals, graphene bilayers, chiral MOFs, amorphous silica films, perovskite thin films, additively manufactured alloys, lithium-ion cathodes, and zeolites. Featured studies include the precession-assisted 3DED of donor–acceptor systems, orientation mechanisms in graphene layers, absolute structural determination and enantiomorph distinction in chiral frameworks, and precession and energy-filtering effects on electron reduced density function analysis of amorphous materials. Methodological advances highlight scanning precession electron tomography for structural analysis of thin-film regions down to 10 nm and best practices for 3DED workflows, while applications address grain boundary engineering in AlSi10Mg alloys, cathode–electrolyte interphase formation in NMC811, and the first complete structure determination of zeolite ECR-1. 2026-04-16T16:01:37Z 2026-04-16T16:01:37Z 2025 book ONIX_20260416T142754_9783725853618_3 9783725853618 9783725853625 https://directory.doabooks.org/handle/20.500.12854/174698 eng application/octet-stream Attribution 4.0 International https://mdpi.com/books/ https://mdpi.com/books/pdfview/book/11572 MDPI - Multidisciplinary Digital Publishing Institute 10.3390/books978-3-7258-5362-5 10.3390/books978-3-7258-5362-5 46cabcaa-dd94-4bfe-87b4-55023c1b36d0 9783725853618 9783725853625 132 CH open access |
| spellingShingle | Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::G Reference, Information and Interdisciplinary subjects::GP Research and information: general Electron Diffraction and Structural Imaging II |
| title | Electron Diffraction and Structural Imaging II |
| title_full | Electron Diffraction and Structural Imaging II |
| title_fullStr | Electron Diffraction and Structural Imaging II |
| title_full_unstemmed | Electron Diffraction and Structural Imaging II |
| title_short | Electron Diffraction and Structural Imaging II |
| title_sort | electron diffraction and structural imaging ii |
| topic | Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::G Reference, Information and Interdisciplinary subjects::GP Research and information: general |
| topic_facet | Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::G Reference, Information and Interdisciplinary subjects::GP Research and information: general |
| url | ONIX_20260416T142754_9783725853618_3 |