Electron Diffraction and Structural Imaging

This Reprint highlights the resurgence of electron diffraction (ED) and structural imaging as key tools for modern structural science. Advances in TEM technology, including Cs correctors, direct detection cameras, and automation, along with methods such as cryo-EM, beam precession, 3D electron diffr...

Täydet tiedot

Bibliografiset tiedot

Aineistotyyppi:	Online
Kieli:	englanti
Julkaistu:	MDPI - Multidisciplinary Digital Publishing Institute 2026
Aiheet:	Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::P Mathematics and Science::PH Physics
Linkit:	ONIX_20260416T142754_9783725853717_33
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