Electron Diffraction and Structural Imaging
This Reprint highlights the resurgence of electron diffraction (ED) and structural imaging as key tools for modern structural science. Advances in TEM technology, including Cs correctors, direct detection cameras, and automation, along with methods such as cryo-EM, beam precession, 3D electron diffr...
保存先:
| フォーマット: | Online |
|---|---|
| 言語: | 英語 |
| 出版事項: |
MDPI - Multidisciplinary Digital Publishing Institute
2026
|
| 主題: | |
| オンライン･アクセス: | ONIX_20260416T142754_9783725853717_33 |
| タグ: |
タグなし, このレコードへの初めてのタグを付けませんか!
|
| _version_ | 1869525594064027648 |
|---|---|
| collection | Directory of Open Access Books |
| description | This Reprint highlights the resurgence of electron diffraction (ED) and structural imaging as key tools for modern structural science. Advances in TEM technology, including Cs correctors, direct detection cameras, and automation, along with methods such as cryo-EM, beam precession, 3D electron diffraction, 4DSTEM, and ptychography, now enable atomic-scale studies of materials inaccessible to conventional X-ray techniques. The first volume gathers 10 contributions spanning lithium-ion cathodes, complex metallic alloys, steels, intermetallics, oxides, MOFs, and thin films. Featured studies address cation disorder in energy materials, symmetry in alloys, hidden retained austenite in steels, and structural evolution in nickelates. Methodological studies include low-dose diffraction tomography, precession-assisted phase and orientation mapping, and global optimization for incomplete 3DED datasets. |
| format | Online |
| id | doab-20.500.12854ir-174778 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2026 |
| publishDateRange | 2026 |
| publishDateSort | 2026 |
| publisher | MDPI - Multidisciplinary Digital Publishing Institute |
| publisherStr | MDPI - Multidisciplinary Digital Publishing Institute |
| record_format | ojs |
| spelling | doab-20.500.12854ir-1747782026-04-16T16:21:53Z Electron Diffraction and Structural Imaging Das, Partha Pratim Ponce-Pedraza, Arturo Mugnaioli, Enrico Nicolopoulos, Stavros Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::P Mathematics and Science::PH Physics This Reprint highlights the resurgence of electron diffraction (ED) and structural imaging as key tools for modern structural science. Advances in TEM technology, including Cs correctors, direct detection cameras, and automation, along with methods such as cryo-EM, beam precession, 3D electron diffraction, 4DSTEM, and ptychography, now enable atomic-scale studies of materials inaccessible to conventional X-ray techniques. The first volume gathers 10 contributions spanning lithium-ion cathodes, complex metallic alloys, steels, intermetallics, oxides, MOFs, and thin films. Featured studies address cation disorder in energy materials, symmetry in alloys, hidden retained austenite in steels, and structural evolution in nickelates. Methodological studies include low-dose diffraction tomography, precession-assisted phase and orientation mapping, and global optimization for incomplete 3DED datasets. 2026-04-16T16:21:47Z 2026-04-16T16:21:47Z 2025 book ONIX_20260416T142754_9783725853717_33 9783725853717 9783725853724 https://directory.doabooks.org/handle/20.500.12854/174778 eng application/octet-stream Attribution 4.0 International https://mdpi.com/books/ https://mdpi.com/books/pdfview/book/11657 MDPI - Multidisciplinary Digital Publishing Institute 10.3390/books978-3-7258-5372-4 10.3390/books978-3-7258-5372-4 46cabcaa-dd94-4bfe-87b4-55023c1b36d0 9783725853717 9783725853724 154 CH open access |
| spellingShingle | Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::P Mathematics and Science::PH Physics Electron Diffraction and Structural Imaging |
| title | Electron Diffraction and Structural Imaging |
| title_full | Electron Diffraction and Structural Imaging |
| title_fullStr | Electron Diffraction and Structural Imaging |
| title_full_unstemmed | Electron Diffraction and Structural Imaging |
| title_short | Electron Diffraction and Structural Imaging |
| title_sort | electron diffraction and structural imaging |
| topic | Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::P Mathematics and Science::PH Physics |
| topic_facet | Nanomaterials Electron Diffraction 4DSTEM 3DED MicroED Serial ED Direct Detection Cameras Ptychography In Situ Atomic Imaging Symmetry thema EDItEUR::P Mathematics and Science::PH Physics |
| url | ONIX_20260416T142754_9783725853717_33 |