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Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodo...

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Hovedforfatter: Niknahad, Mahtab
Format: Online
Sprog:engelsk
Udgivet: KIT Scientific Publishing 2021
Fag:
T1-995
Space
High reliability
FPGA
Redundancy
Single Event Upset
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
Online adgang:34923
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Summary:Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.

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