Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodo...
में बचाया:
| मुख्य लेखक: | |
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| स्वरूप: | Online |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
KIT Scientific Publishing
2021
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| विषय: | |
| ऑनलाइन पहुंच: | 34923 |
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| _version_ | 1869524979743195136 |
|---|---|
| author | Niknahad, Mahtab |
| author_browse | Niknahad, Mahtab |
| author_facet | Niknahad, Mahtab |
| author_sort | Niknahad, Mahtab |
| collection | Directory of Open Access Books |
| description | Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations. |
| format | Online |
| id | doab-20.500.12854ir-61792 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2021 |
| publishDateRange | 2021 |
| publishDateSort | 2021 |
| publisher | KIT Scientific Publishing |
| publisherStr | KIT Scientific Publishing |
| record_format | ojs |
| spelling | doab-20.500.12854ir-617922024-04-09T23:15:25Z Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space Niknahad, Mahtab T1-995 Space High reliability FPGA Redundancy Single Event Upset thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations. 2021-02-12T07:15:59Z 2021-02-12T07:15:59Z 2019-07-30 20:01:59 2013 book 34923 21914737 9783731500384 https://directory.doabooks.org/handle/20.500.12854/61792 eng Steinbuch Series on Advances in Information Technology / Karlsruher Institut für Technologie, Institut für Technik der Informationsverarbeitung image/jpeg Attribution-NonCommercial-NoDerivatives 4.0 International https://www.ksp.kit.edu/9783731500384 KIT Scientific Publishing 10.5445/KSP/1000035134 10.5445/KSP/1000035134 68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2 9783731500384 IX, 146 p. open access |
| spellingShingle | T1-995 Space High reliability FPGA Redundancy Single Event Upset thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues Niknahad, Mahtab Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space |
| title | Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space |
| title_full | Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space |
| title_fullStr | Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space |
| title_full_unstemmed | Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space |
| title_short | Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space |
| title_sort | using fine grain approaches for highly reliable design of fpga based systems in space |
| topic | T1-995 Space High reliability FPGA Redundancy Single Event Upset thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues |
| topic_facet | T1-995 Space High reliability FPGA Redundancy Single Event Upset thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues |
| url | 34923 |
| work_keys_str_mv | AT niknahadmahtab usingfinegrainapproachesforhighlyreliabledesignoffpgabasedsystemsinspace |