Εξώφυλλο

Advances in Sensors and Sensing for Technical Condition Assessment and NDT

The adequate assessment of key apparatus conditions is a hot topic in all branches of industry. Various online and offline diagnostic methods are widely applied to provide early detections of any abnormality in exploitation. Furthermore, different sensors may also be applied to capture selected phys...

Πλήρης περιγραφή

Αποθηκεύτηκε σε:
Μορφή: Online
Γλώσσα:Αγγλικά
Έκδοση: MDPI - Multidisciplinary Digital Publishing Institute 2022
Θέματα:
pulse compression
scattering
attenuation
insulation
ultrasonic testing
OLTC
AE sensor
acoustic emission
feature extraction
supervised classification
machine learning
contrast-enhanced ultrasound
muscle perfusion
Nakagami parameter
compounding Nakagami imaging
low-frequency sensor
power transformer
low-frequency noise
genetic algorithm
geometric layout of railway track
track axis identification
tramway loop
route’s polygon
GNSS mobile measurements
vibroarthography
VAG
knee joint
spectral features
frequency analysis
non-invasive examination
lateral temperature gradient
temperature field
boundary conditions
solar radiation intensity
temperature monitoring
non-destructive evaluation
eddy current
3D sensing
inverse problem
wavelet transform
principal component analysis
neural network
incubation
spectrum
image processing
ROC curve
infrasound measurement system
wind turbine
infrasound correlation analysis
measuring scale
thermoelastic deformation
coefficient of thermal expansion
elastic waves
laser ultrasound
Fizeau fiber interferometer
defect identification
high-current pulses
current measurement
high-current shunts
circuit modeling
Rogowski coil
electrodynamic accelerators
n/a
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
Διαθέσιμο Online:ONIX_20220111_9783036526799_991
Ετικέτες: Προσθήκη ετικέτας
Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!

Παρόμοια τεκμήρια: Advances in Sensors and Sensing for Technical Condition Assessment and NDT

Παρόμοια τεκμήρια