Reliability Analysis of Electrotechnical Devices

This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.

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Bibliografiske detaljer
Format:	Online
Sprog:	engelsk
Udgivet:	MDPI - Multidisciplinary Digital Publishing Institute 2022
Fag:	3D-IC (three-dimensional integrated circuit) electromagnetic interference near field measurement SAC305 BGA low temperature fracture failure factorial design of experiment genetic algorithm optimization return loss multiple-input multiple-output (MIMO) single event effects linear energy transfer Monte Carlo simulation radiation hardness pressureless sintered micron silver joints deep space environment extreme thermal shocks reconstruction simulation elastic mechanical properties state of health remaining useful life electrochemistry based electrical model semi-empirical capacity fading model useful life distribution quality and reliability assurance single event effect microdosimetry lineal energy deconvolution gamma process lifetime measurement system analysis reliability estimation GaN operational amplifier proton therapy prompt gamma imaging 3D X-ray bias temperature-humidity reliability test conductive anodic filament (CAF) de-penalization finite element analysis n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
Online adgang:	ONIX_20220812_9783036546537_89
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Reliability Analysis of Electrotechnical Devices

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