| _version_ | 1869535298708307968 |
|---|---|
| collection | Directory of Open Access |
| format | Online |
| id | oai:doaj.orgir-journal:830d02637eb74817921a4c91bd0ea65e |
| institution | Directory of Open Access |
| language | EN |
| publishDate | 2022 |
| publishDateRange | 2022 |
| publishDateSort | 2022 |
| publisher | MDPI AG |
| publisherStr | MDPI AG |
| record_format | ojs |
| spelling | oai:doaj.orgir-journal:830d02637eb74817921a4c91bd0ea65e2026-01-15T10:39:06ZMetrology2673-8244https://doaj.org/toc/2673-8244ENCC BYMDPI AGhttps://www.mdpi.com/journal/metrology/abouthttps://www.mdpi.com/apchttps://www.mdpi.com/journal/metrology/instructionshttps://www.mdpi.com/journal/metrology2022-11-16T13:55:16Zjournalcyberphysical systemsmachine learning for metrologymetrology for sustainable manufacturingmeasurement uncertainty in dynamic processesElectronic computers. Computer scienceQA75.5-76.95Applied mathematics. Quantitative methodsT57-57.97 |
| spellingShingle | cyberphysical systems machine learning for metrology metrology for sustainable manufacturing measurement uncertainty in dynamic processes Electronic computers. Computer science QA75.5-76.95 Applied mathematics. Quantitative methods T57-57.97 Metrology |
| title | Metrology |
| title_full | Metrology |
| title_fullStr | Metrology |
| title_full_unstemmed | Metrology |
| title_short | Metrology |
| title_sort | metrology |
| topic | cyberphysical systems machine learning for metrology metrology for sustainable manufacturing measurement uncertainty in dynamic processes Electronic computers. Computer science QA75.5-76.95 Applied mathematics. Quantitative methods T57-57.97 |
| topic_facet | cyberphysical systems machine learning for metrology metrology for sustainable manufacturing measurement uncertainty in dynamic processes Electronic computers. Computer science QA75.5-76.95 Applied mathematics. Quantitative methods T57-57.97 |
| url | 2673-8244 |