Retroreflex Ellipsometry for Nonplanar Surfaces
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrat...
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| Materialtyp: | Online |
| Språk: | engelska |
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KIT Scientific Publishing
2025
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| Länkar: | https://library.oapen.org/handle/20.500.12657/101571 |
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| _version_ | 1869518737381523456 |
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| author | Chen, Chia-Wei |
| author_browse | Chen, Chia-Wei |
| author_facet | Chen, Chia-Wei |
| author_sort | Chen, Chia-Wei |
| collection | Directory of Open Access Books |
| description | Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces. |
| format | Online |
| id | doab-20.500.12854ir-159309 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2025 |
| publishDateRange | 2025 |
| publishDateSort | 2025 |
| publisher | KIT Scientific Publishing |
| publisherStr | KIT Scientific Publishing |
| record_format | ojs |
| spelling | doab-20.500.12854ir-1593092025-05-27T07:10:49Z Retroreflex Ellipsometry for Nonplanar Surfaces Chen, Chia-Wei Thin-film metrology; Curved surfaces; Ellipsometry; Mueller matrix; Retroreflex ellipsometry; Dünnschicht- Messtechnik; gekrümmte Oberflächen; Ellipsometrie; Müller-Matrix; Retroreflex-Ellipsometrie thema EDItEUR::U Computing and Information Technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces. 2025-05-13T04:32:37Z 2025-05-13T04:32:37Z 2025-05-12T10:05:22Z 2025 book https://library.oapen.org/handle/20.500.12657/101571 9783731514022 https://directory.doabooks.org/handle/20.500.12854/159309 eng Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung open access image/jpeg Attribution 4.0 International https://library.oapen.org/bitstream/20.500.12657/101571/1/retroreflex-ellipsometry-for-nonplanar-surfaces.pdf KIT Scientific Publishing 10.5445/KSP/1000177504 10.5445/KSP/1000177504 68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2 9783731514022 208 open access |
| spellingShingle | Thin-film metrology; Curved surfaces; Ellipsometry; Mueller matrix; Retroreflex ellipsometry; Dünnschicht- Messtechnik; gekrümmte Oberflächen; Ellipsometrie; Müller-Matrix; Retroreflex-Ellipsometrie thema EDItEUR::U Computing and Information Technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists Chen, Chia-Wei Retroreflex Ellipsometry for Nonplanar Surfaces |
| title | Retroreflex Ellipsometry for Nonplanar Surfaces |
| title_full | Retroreflex Ellipsometry for Nonplanar Surfaces |
| title_fullStr | Retroreflex Ellipsometry for Nonplanar Surfaces |
| title_full_unstemmed | Retroreflex Ellipsometry for Nonplanar Surfaces |
| title_short | Retroreflex Ellipsometry for Nonplanar Surfaces |
| title_sort | retroreflex ellipsometry for nonplanar surfaces |
| topic | Thin-film metrology; Curved surfaces; Ellipsometry; Mueller matrix; Retroreflex ellipsometry; Dünnschicht- Messtechnik; gekrümmte Oberflächen; Ellipsometrie; Müller-Matrix; Retroreflex-Ellipsometrie thema EDItEUR::U Computing and Information Technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists |
| topic_facet | Thin-film metrology; Curved surfaces; Ellipsometry; Mueller matrix; Retroreflex ellipsometry; Dünnschicht- Messtechnik; gekrümmte Oberflächen; Ellipsometrie; Müller-Matrix; Retroreflex-Ellipsometrie thema EDItEUR::U Computing and Information Technology::UY Computer science::UYA Mathematical theory of computation::UYAM Maths for computer scientists |
| url | https://library.oapen.org/handle/20.500.12657/101571 |
| work_keys_str_mv | AT chenchiawei retroreflexellipsometryfornonplanarsurfaces |