RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...
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| Үндсэн зохиолч: | |
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| Формат: | Online |
| Хэл сонгох: | англи |
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KIT Scientific Publishing
2021
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| Нөхцлүүд: | |
| Онлайн хандалт: | 34153 |
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Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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| _version_ | 1869526013841506304 |
|---|---|
| author | Müller, Daniel |
| author_browse | Müller, Daniel |
| author_facet | Müller, Daniel |
| author_sort | Müller, Daniel |
| collection | Directory of Open Access Books |
| description | Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions. |
| format | Online |
| id | doab-20.500.12854ir-58448 |
| institution | Directory of Open Access Books |
| language | eng |
| publishDate | 2021 |
| publishDateRange | 2021 |
| publishDateSort | 2021 |
| publisher | KIT Scientific Publishing |
| publisherStr | KIT Scientific Publishing |
| record_format | ojs |
| spelling | doab-20.500.12854ir-584482024-04-09T23:15:31Z RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range Müller, Daniel T1-995 On-Wafer Measurements Monolithic Microwave Integrated Circuits Halbleiterschaltungen Messtechnik Hochfrequenztechnik Electromagnetic Field Simulation Elektromagnetische Feldsimulation Radio Frequency thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions. 2021-02-12T02:16:46Z 2021-02-12T02:16:46Z 2019-07-28 18:37:01 2018 book 34153 18684696 9783731508229 https://directory.doabooks.org/handle/20.500.12854/58448 eng Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik image/jpeg Attribution-ShareAlike 4.0 International https://www.ksp.kit.edu/9783731508229 KIT Scientific Publishing 10.5445/KSP/1000084392 10.5445/KSP/1000084392 68fffc18-8f7b-44fa-ac7e-0b7d7d979bd2 9783731508229 XII, 180 p. open access |
| spellingShingle | T1-995 On-Wafer Measurements Monolithic Microwave Integrated Circuits Halbleiterschaltungen Messtechnik Hochfrequenztechnik Electromagnetic Field Simulation Elektromagnetische Feldsimulation Radio Frequency thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues Müller, Daniel RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range |
| title | RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range |
| title_full | RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range |
| title_fullStr | RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range |
| title_full_unstemmed | RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range |
| title_short | RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range |
| title_sort | rf probe induced on wafer measurement errors in the millimeter wave frequency range |
| topic | T1-995 On-Wafer Measurements Monolithic Microwave Integrated Circuits Halbleiterschaltungen Messtechnik Hochfrequenztechnik Electromagnetic Field Simulation Elektromagnetische Feldsimulation Radio Frequency thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues |
| topic_facet | T1-995 On-Wafer Measurements Monolithic Microwave Integrated Circuits Halbleiterschaltungen Messtechnik Hochfrequenztechnik Electromagnetic Field Simulation Elektromagnetische Feldsimulation Radio Frequency thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues |
| url | 34153 |
| work_keys_str_mv | AT mullerdaniel rfprobeinducedonwafermeasurementerrorsinthemillimeterwavefrequencyrange |