RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simula...
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| Главный автор: | |
|---|---|
| Формат: | Online |
| Язык: | английский |
| Опубликовано: |
KIT Scientific Publishing
2021
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| Предметы: | |
| Online-ссылка: | 34153 |
| Метки: |
Нет меток, Требуется 1-ая метка записи!
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