Breitbandige Frequenzweichen für die Parallelisierung von Millimeterwellen-Messtechnik
This work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realizatio...
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| 主要作者: | |
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| 格式: | Online |
| 語言: | 德语 |
| 出版: |
KIT Scientific Publishing
2021
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| 主題: | |
| 在線閱讀: | ONIX_20210723_9783731510789_7 |
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