Breitbandige Frequenzweichen für die Parallelisierung von Millimeterwellen-Messtechnik

This work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realizatio...

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Dettagli Bibliografici
Autore principale: Klaus Boes, Florian
Natura: Online
Lingua:tedesco
Pubblicazione: KIT Scientific Publishing 2021
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Accesso online:ONIX_20210723_9783731510789_7
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Riassunto:This work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realization of a DC – 110 GHz – 170 GHz diplexer for the first time.