Optical In-Process Measurement Systems

Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process mea...

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פורמט: Online
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יצא לאור: MDPI - Multidisciplinary Digital Publishing Institute 2022
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גישה מקוונת:ONIX_20220621_9783036538495_39
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_version_ 1869515262976327680
collection Directory of Open Access Books
description Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process measurements. Presented within this book is a selection of promising optical measurement approaches for real-world applications.
format Online
id doab-20.500.12854ir-84461
institution Directory of Open Access Books
language eng
publishDate 2022
publishDateRange 2022
publishDateSort 2022
publisher MDPI - Multidisciplinary Digital Publishing Institute
publisherStr MDPI - Multidisciplinary Digital Publishing Institute
record_format ojs
spelling doab-20.500.12854ir-844612024-04-09T23:15:55Z Optical In-Process Measurement Systems Fischer, Andreas speckle photography in-process measurement deep rolling process generalized phase shifting interferometry dual-aperture common-path interferometer real-time optical instrumentation optomechatronic systems electrical steel optical coherence tomography OCT scanning process monitoring laser material processing spot compensation low coherence interferometry LCI wind lidar Doppler lidar bistatic metrology traceability wind energy meteorology diffraction grating grating pitch mode-locked femtosecond laser laser diffraction diffraction equation measurement uncertainty analysis image processing pattern recognition wind energy turbines turbulence wedges coherence scanning interferometry in-process application Mirau interferometer vibration compensation interferometric distance sensor optical path length modulation oscillating reference mirror hairpin laser welding semantic segmentation dilated convolution sdu-net spatter detection quality assurance fast prediction time in situ measurement optical metrology quality control interferometry fringe projection computational shear interferometry coherence function structure function additive manufacturing medium voltage switchgear SF6 alternatives UV-Vis spectroscopy gas mixing modeling multicomponent diffusion analysis explosion coal dust methane explosion suppression spectral characteristics explosion pressure radiation intensity free radicals n/a thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology Information is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process measurements. Presented within this book is a selection of promising optical measurement approaches for real-world applications. 2022-06-21T08:37:00Z 2022-06-21T08:37:00Z 2022 book ONIX_20220621_9783036538495_39 9783036538495 9783036538501 https://directory.doabooks.org/handle/20.500.12854/84461 eng application/octet-stream Attribution 4.0 International https://mdpi.com/books/pdfview/book/5444 https://mdpi.com/books/pdfview/book/5444 MDPI - Multidisciplinary Digital Publishing Institute 10.3390/books978-3-0365-3850-1 10.3390/books978-3-0365-3850-1 46cabcaa-dd94-4bfe-87b4-55023c1b36d0 9783036538495 9783036538501 194 Basel open access
spellingShingle speckle photography
in-process measurement
deep rolling process
generalized phase shifting interferometry
dual-aperture common-path interferometer
real-time optical instrumentation
optomechatronic systems
electrical steel
optical coherence tomography
OCT
scanning
process monitoring
laser material processing
spot compensation
low coherence interferometry
LCI
wind lidar
Doppler lidar
bistatic
metrology
traceability
wind energy
meteorology
diffraction grating
grating pitch
mode-locked femtosecond laser
laser diffraction
diffraction equation
measurement uncertainty analysis
image processing
pattern recognition
wind energy turbines
turbulence wedges
coherence scanning interferometry
in-process application
Mirau interferometer
vibration compensation
interferometric distance sensor
optical path length modulation
oscillating reference mirror
hairpin
laser welding
semantic segmentation
dilated convolution
sdu-net
spatter detection
quality assurance
fast prediction time
in situ measurement
optical metrology
quality control
interferometry
fringe projection
computational shear interferometry
coherence function
structure function
additive manufacturing
medium voltage switchgear
SF6 alternatives
UV-Vis spectroscopy
gas mixing modeling
multicomponent diffusion analysis
explosion
coal dust
methane
explosion suppression
spectral characteristics
explosion pressure
radiation intensity
free radicals
n/a
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
Optical In-Process Measurement Systems
title Optical In-Process Measurement Systems
title_full Optical In-Process Measurement Systems
title_fullStr Optical In-Process Measurement Systems
title_full_unstemmed Optical In-Process Measurement Systems
title_short Optical In-Process Measurement Systems
title_sort optical in process measurement systems
topic speckle photography
in-process measurement
deep rolling process
generalized phase shifting interferometry
dual-aperture common-path interferometer
real-time optical instrumentation
optomechatronic systems
electrical steel
optical coherence tomography
OCT
scanning
process monitoring
laser material processing
spot compensation
low coherence interferometry
LCI
wind lidar
Doppler lidar
bistatic
metrology
traceability
wind energy
meteorology
diffraction grating
grating pitch
mode-locked femtosecond laser
laser diffraction
diffraction equation
measurement uncertainty analysis
image processing
pattern recognition
wind energy turbines
turbulence wedges
coherence scanning interferometry
in-process application
Mirau interferometer
vibration compensation
interferometric distance sensor
optical path length modulation
oscillating reference mirror
hairpin
laser welding
semantic segmentation
dilated convolution
sdu-net
spatter detection
quality assurance
fast prediction time
in situ measurement
optical metrology
quality control
interferometry
fringe projection
computational shear interferometry
coherence function
structure function
additive manufacturing
medium voltage switchgear
SF6 alternatives
UV-Vis spectroscopy
gas mixing modeling
multicomponent diffusion analysis
explosion
coal dust
methane
explosion suppression
spectral characteristics
explosion pressure
radiation intensity
free radicals
n/a
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
topic_facet speckle photography
in-process measurement
deep rolling process
generalized phase shifting interferometry
dual-aperture common-path interferometer
real-time optical instrumentation
optomechatronic systems
electrical steel
optical coherence tomography
OCT
scanning
process monitoring
laser material processing
spot compensation
low coherence interferometry
LCI
wind lidar
Doppler lidar
bistatic
metrology
traceability
wind energy
meteorology
diffraction grating
grating pitch
mode-locked femtosecond laser
laser diffraction
diffraction equation
measurement uncertainty analysis
image processing
pattern recognition
wind energy turbines
turbulence wedges
coherence scanning interferometry
in-process application
Mirau interferometer
vibration compensation
interferometric distance sensor
optical path length modulation
oscillating reference mirror
hairpin
laser welding
semantic segmentation
dilated convolution
sdu-net
spatter detection
quality assurance
fast prediction time
in situ measurement
optical metrology
quality control
interferometry
fringe projection
computational shear interferometry
coherence function
structure function
additive manufacturing
medium voltage switchgear
SF6 alternatives
UV-Vis spectroscopy
gas mixing modeling
multicomponent diffusion analysis
explosion
coal dust
methane
explosion suppression
spectral characteristics
explosion pressure
radiation intensity
free radicals
n/a
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues
thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TB Technology: general issues::TBX History of engineering and technology
url ONIX_20220621_9783036538495_39